Content of review 1, reviewed on March 07, 2025

The author(s) have incorporated attention mechanism in BART and T5 large language models for topic modeling for evaluating root cause analysis in manufacturing defects. The reviewer would like to point out a few concerns

1 A very short summary of BART and T5 could be incorporated into the manuscript.
2 Statistical analysis of your work could also be incorporated
3 Analysis in terms of manufacturing data is missing.
4 Literature survey could be a bit more strengthened. This might be useful in your work https://doi.org/10.1007/s13198-024-02280-4
4 Specify the learning rate, batch size and maximum sequence length for BART and T5.

Source

    © 2025 the Reviewer (CC BY 4.0).

References

    Vutivi, M., K., C. U. A., S., P. B. 2025. Neural Topic Generation Utilizing Attention Mechanisms With Transformer-Based Embeddings for Root-Cause Analysis of Manufacturing Defects in Electronic Products. Engineering Reports.